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Fundamentals of Forensic Science By Max M. Houck, Jay A. Siegel
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- Sales Rank: #1036784 in Books
- Published on: 2006-04-28
- Original language: English
- Number of items: 1
- Dimensions: 1.70" h x 7.98" w x 9.84" l, 1.10 pounds
- Binding: Hardcover
- 688 pages
Review
“[This book] approaches the field from a truly unique and exciting perspective . . . everything a student or practicing professional needs." - The Journal of Law Enforcement
About the Author
Dr. Max M. Houck is an internationally-recognized forensic expert with research interests in forensic science, education, and the forensic enterprise and its industries. He has worked in all aspects of forensic science, including at the FBI Laboratory. Dr. Houck has published widely in books and peer-reviewed journals. His anthropology and trace evidence casework includes the Branch Davidian Investigation, the September 11 attacks on the Pentagon, the D.B. Cooper case, the US Embassy bombings in Africa, and the West Memphis Three case, among hundreds of others. He served for six years as the Chair of the Forensic Science Educational Program Accreditation Commission (FEPAC). Dr. Houck is a Fellow of the Royal Society of Chemistry and a founding Co-Editor of the journal Forensic Science Policy and Management.
Jay Siegel, PhD is retired Director of the Forensic and Investigative Sciences Program and Chair of the Department of Chemistry and Chemical Biology at Indiana University Purdue University Indianapolis. He was Director of the Forensic Science Program at Michigan State University for 25 years from 1980-2004 until his retirement as Professor Emeritus. Dr. Siegel is a Distinguished Member of the American Academy of Forensic Sciences and was named as Distinguished Alumni Scholar by his alma mater, George Washington University in 2011. He is co-editor of Forensic Science Policy and Management: An International Journal. He was a member of the National Academy of Sciences Forensic Science Committee from 2006-09.
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